Seongi Lee¹, Jae-Myeong Shin¹, Jun Hyeok Hyun, In-Suk Choi, Young-Chang Joo, Byoung-Joon Kim*, So-Yeon Lee*, “Effect of Ag agglomeration-driven nanovoids formation on fatigue reliability of Cu–Ag alloy flexible interconnects”, Journal of Materials Research and Technology, 2024, 29, 851-856, DOI: https://doi.org/10.1016/j.jmrt.2024.01.135