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서울대학교 미세유연소자재료 연구실SNU Nano Flexible Device Materials Lab

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Electrical Reliability and Bending Test Methodologies of Metal Electrode on Flexible substrate

Home Electrical Reliability and Bending Test Methodologies of Metal Electrode on Flexible substrate

Electrical Reliability and Bending Test Methodologies of Metal Electrode on Flexible substrate

저자

Byoung-Joon Kim*, Young-Bae Park, and Young-Chang Joo*

저널 정보

Journal of Nanoscience and Nanotechnology, 2020, 20, 470-477

출간연도

2020

링크

https://pubmed.ncbi.nlm.nih.gov/31383195/

Byoung-Joon Kim*, Young-Bae Park, and Young-Chang Joo*, “Electrical Reliability and Bending Test Methodologies of Metal Electrode on Flexible substrate”, Journal of Nanoscience and Nanotechnology, 2020, 20, 470-477, doi:10.1166/jnn.2020.17226