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Electromigration-Induced Plasticity: Texture Correlation and Implications for Reliability Assessment

Home Electromigration-Induced Plasticity: Texture Correlation and Implications for Reliability Assessment

Electromigration-Induced Plasticity: Texture Correlation and Implications for Reliability Assessment

저자

A.S. Budiman, P.R. Besser, C.S. Hau-Riege, A. Marathe, Y.-C. Joo, N. Tamura, J.R. Patel, and W.D. Nix

저널 정보

J. Elec. Mat. 38, pp.379-391 (2009).

출간연도

2009

링크

https://doi.org/10.1007/s11664-008-0602-5

A.S. Budiman, P.R. Besser, C.S. Hau-Riege, A. Marathe, Y.-C. Joo, N. Tamura, J.R. Patel, and W.D. Nix, “Electromigration-Induced Plasticity: Texture Correlation and Implications for Reliability Assessment”, J. Elec. Mat. 38, pp.379-391 (2009).