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서울대학교 미세유연소자재료 연구실SNU Nano Flexible Device Materials Lab

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In-situ observation of electromigraion in eutectic SnPb solder lines : Atomic migraion and hillock formation

Home In-situ observation of electromigraion in eutectic SnPb solder lines : Atomic migraion and hillock formation

In-situ observation of electromigraion in eutectic SnPb solder lines : Atomic migraion and hillock formation

저자

M.-S. Yoon, M.-K. Ko, O.-h. Kim, Y.-B. Park, W.D. Nix, Y.-C. Joo

저널 정보

J. Elec. Mat., 36, pp.562 (2007).

출간연도

2007

링크

https://link.springer.com/article/10.1007/s11664-007-0102-z

M.-S. Yoon, M.-K. Ko, O.-h. Kim, Y.-B. Park, W.D. Nix, Y.-C. Joo, “In-situ observation of electromigraion in eutectic SnPb solder lines : Atomic migraion and hillock formation”, J. Elec. Mat., 36, pp.562 (2007).