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Intermetallic Compound Growth and Reliability of Cu Pillar Bumps Under Current Stressing

Intermetallic Compound Growth and Reliability of Cu Pillar Bumps Under Current Stressing

저자

B.-J. Kim, G.-T. Lim, J. Kim, K. Lee, Y.-B. Park, H.-Y. Lee, and Y.-C. Joo

저널 정보

J. Elec. Mat., Article in Press, pp. 1-5 (2010).

출간연도

2010

B.-J. Kim, G.-T. Lim, J. Kim, K. Lee, Y.-B. Park, H.-Y. Lee, and Y.-C. Joo, “Intermetallic Compound Growth and Reliability of Cu Pillar Bumps Under Current Stressing”, J. Elec. Mat., Article in Press, pp. 1-5 (2010).