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서울대학교 미세유연소자재료 연구실SNU Nano Flexible Device Materials Lab

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Line length dependence of threshold current density and driving force in eutectic SbPb and SnAgCu solder electromigraion

Home Line length dependence of threshold current density and driving force in eutectic SbPb and SnAgCu solder electromigraion

Line length dependence of threshold current density and driving force in eutectic SbPb and SnAgCu solder electromigraion

저자

M.-S. Yoon, M.-K. Ko, B.-N. Kim, and B.-J. Kim, Y.-B. Park, Y.-C. Joo

저널 정보

J. Appl. Phys. 103(7), pp. 073701 (2008).

출간연도

2008

링크

https://doi.org/10.1063/1.2890412

M.-S. Yoon, M.-K. Ko, B.-N. Kim, and B.-J. Kim, Y.-B. Park, Y.-C. Joo, “Line length dependence of threshold current density and driving force in eutectic SbPb and SnAgCu solder electromigraion”, J. Appl. Phys. 103(7), pp. 073701 (2008).